Solicitation Number: NIST-FY25-CHIPS-0054
Date Added: January 30, 2025
Notice ID Number: NIST-FY25-CHIPS-0054
Title: Sources Sought Notice for Cavity Ringdown Gas Analyzer for Trace Moisture
The purpose of this sources sought notice is to conduct market research and identify potential sources of commercial products/services that satisfy the Government’s anticipated needs.
BACKGROUND
The National Institute of Standards and Technology (NIST) is developing in situ process diagnostics for vapor phase deposition processes used in semiconductor manufacturing. Run within the Material Measurement Laboratory (MML), this program aims to design and evaluate new metrology capabilities to address needs in advanced process control and modeling for high volume manufacturing. The Chemical Process and Nuclear Measurements Group in the Chemical Sciences Division has specialized ultra-high purity gas handling systems, test stands for precursor delivery characterization, and deposition reactors for thin film growth characterization. These flow systems are equipped with various in situ and inline measurements used to characterize precursor concentration, flow rate, gas phase reactions, and surface reactions. The group has undertaken a project in the CHIPS R&D Metrology program focused on Digital Twins for Atomic Layer Deposition (ALD) Processes. In support of this work, the group requires a gas analyzer based on cavity ringdown spectroscopy (CRDS) and configured for trace moisture analysis (<1 ppb) in a semiconductor-grade vacuum system. The gas analyzer will be used in a research laboratory that houses multiple ultra-high purity flow systems, each handling highly moisture sensitive chemicals used in semiconductor manufacturing. The purpose of the analyzer is to quantify water vapor partial pressure in vacuum lines (down to 1 Torr) that handle inert carrier gases such as nitrogen or argon. Quantifying moisture in the flow systems is critical to identifying byproduct or impurity species that originate due to reaction with water vapor. The group seeks a CRDS trace moisture analyzer that is compatible with high-purity semiconductor vacuum systems, exhibits high sensitivity and stability, and has a small physical footprint.
NIST is seeking information from sources that may be capable of providing a solution that will achieve the objectives described above.
HOW TO RESPOND TO THIS NOTICE
In responding to this notice, please DO NOT PROVIDE PROPRIETARY INFORMATION. Please include only the following information, readable in either Microsoft Word 365, Microsoft Excel 365, or .pdf format, in the response: Submit the response by email to the Primary Point of Contact and, if specified, to the Secondary Point of Contact listed in this notice as soon as possible, and preferably before the closing date and time of this notice. Please note that to be considered for award under any official solicitation, the entity must be registered and “active” in SAM at the time of solicitation response.
Set-Aside: N/A (N/A)
Place of Performance: Gaithersburg, Maryland, UNITED STATES
NAICS Codes:
334516